Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD
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چکیده
منابع مشابه
Enhanced and stable photoluminescence from partially oxidized porous Si coated with Si thin films
Photoluminescence ~PL! spectra of partially oxidized porous Si ~POPS! coated with Si thin films were examined using the 488 nm line of Ar laser. The obtained PL is stable, peaks at 1.763 eV with a blueshift of ;60 meV, and its maximal intensity is seven times larger than that of the POPS. Spectral analysis and the experimental results from infrared spectroscopy and electron spin resonance sugge...
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ژورنال
عنوان ژورنال: International Journal of Photoenergy
سال: 2012
ISSN: 1110-662X,1687-529X
DOI: 10.1155/2012/418924