Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD

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ژورنال

عنوان ژورنال: International Journal of Photoenergy

سال: 2012

ISSN: 1110-662X,1687-529X

DOI: 10.1155/2012/418924